NCT03819244View on ClinicalTrials.gov

Comparison of Er,Cr:YSGG and Diode Lasers In Second Stage Implant Surgery

NACompletedINTERVENTIONAL
Enrollment

40

Participants

Timeline

Start Date

November 27, 2017

Primary Completion Date

May 24, 2018

Study Completion Date

August 20, 2018

Conditions
Postoperative PainSoft Tissue BleedingWound Heal
Interventions
DEVICE

940 nm Gallium Aluminum Arsenide Diode Laser

Exposure of the cover screw of osseointegrated dental implants embedded under oral mucosa by performing the soft tissue incision with diode laser for placing the healing abutment.

DEVICE

2780 nm Er,Cr:YSGG Laser

Exposure of the cover screw of osseointegrated dental implants embedded under oral mucosa by performing the soft tissue incision with erbium laser for placing the healing abutment.

Trial Locations (1)

65080

Yuzuncu Yil University Faculty of Dentistry, Van

All Listed Sponsors
lead

Yuzuncu Yıl University

OTHER

NCT03819244 - Comparison of Er,Cr:YSGG and Diode Lasers In Second Stage Implant Surgery | Biotech Hunter | Biotech Hunter